X-Git-Url: http://git.droids-corp.org/?a=blobdiff_plain;f=app%2Ftest%2Ftest_debug.c;h=23b24db177394919cd2e52f2d566317e001c9688;hb=f0243339496d48e6f5d76e6ef6741d6986b965d0;hp=ae7be52535e5d9818485319ac417cd2d8639d5dd;hpb=21a7f4e2646e1cb6b0dbd6643e5d64f72355af58;p=dpdk.git diff --git a/app/test/test_debug.c b/app/test/test_debug.c index ae7be52535..23b24db177 100644 --- a/app/test/test_debug.c +++ b/app/test/test_debug.c @@ -1,75 +1,27 @@ -/*- - * BSD LICENSE - * - * Copyright(c) 2010-2014 Intel Corporation. All rights reserved. - * All rights reserved. - * - * Redistribution and use in source and binary forms, with or without - * modification, are permitted provided that the following conditions - * are met: - * - * * Redistributions of source code must retain the above copyright - * notice, this list of conditions and the following disclaimer. - * * Redistributions in binary form must reproduce the above copyright - * notice, this list of conditions and the following disclaimer in - * the documentation and/or other materials provided with the - * distribution. - * * Neither the name of Intel Corporation nor the names of its - * contributors may be used to endorse or promote products derived - * from this software without specific prior written permission. - * - * THIS SOFTWARE IS PROVIDED BY THE COPYRIGHT HOLDERS AND CONTRIBUTORS - * "AS IS" AND ANY EXPRESS OR IMPLIED WARRANTIES, INCLUDING, BUT NOT - * LIMITED TO, THE IMPLIED WARRANTIES OF MERCHANTABILITY AND FITNESS FOR - * A PARTICULAR PURPOSE ARE DISCLAIMED. IN NO EVENT SHALL THE COPYRIGHT - * OWNER OR CONTRIBUTORS BE LIABLE FOR ANY DIRECT, INDIRECT, INCIDENTAL, - * SPECIAL, EXEMPLARY, OR CONSEQUENTIAL DAMAGES (INCLUDING, BUT NOT - * LIMITED TO, PROCUREMENT OF SUBSTITUTE GOODS OR SERVICES; LOSS OF USE, - * DATA, OR PROFITS; OR BUSINESS INTERRUPTION) HOWEVER CAUSED AND ON ANY - * THEORY OF LIABILITY, WHETHER IN CONTRACT, STRICT LIABILITY, OR TORT - * (INCLUDING NEGLIGENCE OR OTHERWISE) ARISING IN ANY WAY OUT OF THE USE - * OF THIS SOFTWARE, EVEN IF ADVISED OF THE POSSIBILITY OF SUCH DAMAGE. +/* SPDX-License-Identifier: BSD-3-Clause + * Copyright(c) 2010-2014 Intel Corporation */ #include #include +#include +#include #include #include #include #include #include +#include #include "test.h" /* * Debug test * ========== - * - * - Call rte_dump_stack() and rte_dump_registers(). The result is not checked - * currently, as the functions are not implemented on baremetal. - * - Check that rte_panic() terminates the program using a non-zero error code. - * (Only implemented on linux, since it requires the fork() system call) */ -#ifdef RTE_EXEC_ENV_BAREMETAL - -/* baremetal - don't test rte_panic or rte_exit */ -static int -test_panic(void) -{ - return 0; -} - -static int -test_exit(void) -{ - return 0; -} - -#else - -/* linuxapp - use fork() to test rte_panic() */ +/* use fork() to test rte_panic() */ static int test_panic(void) { @@ -78,9 +30,14 @@ test_panic(void) pid = fork(); - if (pid == 0) + if (pid == 0) { + struct rlimit rl; + + /* No need to generate a coredump when panicking. */ + rl.rlim_cur = rl.rlim_max = 0; + setrlimit(RLIMIT_CORE, &rl); rte_panic("Test Debug\n"); - else if (pid < 0){ + } else if (pid < 0) { printf("Fork Failed\n"); return -1; } @@ -94,13 +51,18 @@ test_panic(void) return 0; } -/* linuxapp - use fork() to test rte_exit() */ +/* use fork() to test rte_exit() */ static int test_exit_val(int exit_val) { int pid; int status; + /* manually cleanup EAL memory, as the fork() below would otherwise + * cause the same hugepages to be free()-ed multiple times. + */ + rte_service_finalize(); + pid = fork(); if (pid == 0) @@ -111,13 +73,11 @@ test_exit_val(int exit_val) } wait(&status); printf("Child process status: %d\n", status); -#ifndef RTE_EAL_ALWAYS_PANIC_ON_ERROR if(!WIFEXITED(status) || WEXITSTATUS(status) != (uint8_t)exit_val){ printf("Child process terminated with incorrect status (expected = %d)!\n", exit_val); return -1; } -#endif return 0; } @@ -126,7 +86,7 @@ test_exit(void) { int test_vals[] = { 0, 1, 2, 255, -1 }; unsigned i; - for (i = 0; i < sizeof(test_vals) / sizeof(test_vals[0]); i++){ + for (i = 0; i < RTE_DIM(test_vals); i++) { if (test_exit_val(test_vals[i]) < 0) return -1; } @@ -134,8 +94,6 @@ test_exit(void) return 0; } -#endif - static void dummy_app_usage(const char *progname) { @@ -156,11 +114,10 @@ test_usage(void) return 0; } -int +static int test_debug(void) { rte_dump_stack(); - rte_dump_registers(); if (test_panic() < 0) return -1; if (test_exit() < 0) @@ -169,3 +126,5 @@ test_debug(void) return -1; return 0; } + +REGISTER_TEST_COMMAND(debug_autotest, test_debug);