From: Fan Zhang <roy.fan.zhang@intel.com>
Date: Thu, 5 Nov 2020 13:58:57 +0000 (+0000)
Subject: test/crypto: fix out-of-place test
X-Git-Url: http://git.droids-corp.org/?a=commitdiff_plain;h=4682c52dc567891942cc7e3ef7bc2e88c661c2f0;p=dpdk.git

test/crypto: fix out-of-place test

This patch fixes bypassed out of place test for PMDs that support it.

Fixes: 4868f6591c6f ("test/crypto: add cases for raw datapath API")

Signed-off-by: Fan Zhang <roy.fan.zhang@intel.com>
Acked-by: Adam Dybkowski <adamx.dybkowski@intel.com>
---

diff --git a/app/test/test_cryptodev.c b/app/test/test_cryptodev.c
index d7d7ab5c68..8189053c13 100644
--- a/app/test/test_cryptodev.c
+++ b/app/test/test_cryptodev.c
@@ -6771,9 +6771,6 @@ test_mixed_auth_cipher(const struct mixed_cipher_auth_test_data *tdata,
 		return -ENOTSUP;
 	}
 
-	if (op_mode == OUT_OF_PLACE)
-		return -ENOTSUP;
-
 	/* Create the session */
 	if (verify)
 		retval = create_wireless_algo_cipher_auth_session(