From 52db57db0536bf20cbb50464ca4c18b0c9fde4e4 Mon Sep 17 00:00:00 2001 From: Nithin Dabilpuram Date: Fri, 15 Jan 2021 13:02:43 +0530 Subject: [PATCH] test/mem: fix page size for external memory Currently external memory test uses 4K page size. VFIO DMA mapping works only with system page granularity. Earlier it was working because all the contiguous mappings were coalesced and mapped in one-go which ended up becoming a lot bigger page. Now that VFIO DMA mappings both in IOVA as VA and IOVA as PA mode, are being done at memseg list granularity, we need to use system page size. Fixes: b270daa43b3d ("test: support external memory") Cc: stable@dpdk.org Signed-off-by: Nithin Dabilpuram Acked-by: Anatoly Burakov --- app/test/test_external_mem.c | 3 ++- 1 file changed, 2 insertions(+), 1 deletion(-) diff --git a/app/test/test_external_mem.c b/app/test/test_external_mem.c index 7eb81f6448..5edf88b9f6 100644 --- a/app/test/test_external_mem.c +++ b/app/test/test_external_mem.c @@ -13,6 +13,7 @@ #include #include #include +#include #include #include #include @@ -532,8 +533,8 @@ fail: static int test_external_mem(void) { + size_t pgsz = rte_mem_page_size(); size_t len = EXTERNAL_MEM_SZ; - size_t pgsz = RTE_PGSIZE_4K; rte_iova_t iova[len / pgsz]; void *addr; int ret, n_pages; -- 2.20.1