From 9038ea4674cf2d9cf2ae573c48b999b9d41dc3c4 Mon Sep 17 00:00:00 2001 From: Dharmik Thakkar Date: Tue, 26 Feb 2019 17:02:28 -0600 Subject: [PATCH] test/efd: replace config macro with runtime log level This patch enables compilation of print_key_info() always using log-level based approach instead of a macro. Need to set efd log type to debug to print debug information, using the following eal parameter: --log-level=test.efd:debug Suggested-by: Thomas Monjalon Signed-off-by: Dharmik Thakkar Reviewed-by: Honnappa Nagarahalli Reviewed-by: Gavin Hu Reviewed-by: Phil Yang Reviewed-by: Ferruh Yigit --- app/test/test_efd.c | 24 +++++++++++------------- 1 file changed, 11 insertions(+), 13 deletions(-) diff --git a/app/test/test_efd.c b/app/test/test_efd.c index ced091aab6..93e8f1cbb8 100644 --- a/app/test/test_efd.c +++ b/app/test/test_efd.c @@ -31,31 +31,29 @@ struct flow_key { uint16_t port_dst; uint8_t proto; } __attribute__((packed)); + +int efd_logtype_test; + +RTE_INIT(test_efd_init_log) +{ + efd_logtype_test = rte_log_register("test.efd"); +} + /* * Print out result of unit test efd operation. */ -#if defined(UNIT_TEST_EFD_VERBOSE) - static void print_key_info(const char *msg, const struct flow_key *key, efd_value_t val) { const uint8_t *p = (const uint8_t *) key; unsigned int i; - printf("%s key:0x", msg); + rte_log(RTE_LOG_DEBUG, efd_logtype_test, "%s key:0x", msg); for (i = 0; i < sizeof(struct flow_key); i++) - printf("%02X", p[i]); + rte_log(RTE_LOG_DEBUG, efd_logtype_test, "%02X", p[i]); - printf(" @ val %d\n", val); + rte_log(RTE_LOG_DEBUG, efd_logtype_test, " @ val %d\n", val); } -#else - -static void print_key_info(__attribute__((unused)) const char *msg, - __attribute__((unused)) const struct flow_key *key, - __attribute__((unused)) efd_value_t val) -{ -} -#endif /* Keys used by unit test functions */ static struct flow_key keys[5] = { -- 2.20.1