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(parent: a5563b8) | patch
test: reduce time for function reentrancy test
authorNaga Suresh Somarowthu <naga.sureshx.somarowthu@intel.com>
Wed, 10 Oct 2018 13:15:12 +0000 (14:15 +0100)
committerThomas Monjalon <thomas@monjalon.net>
Tue, 6 Nov 2018 02:20:26 +0000 (03:20 +0100)
commit737f5813a7980a982e0bf972d2b7e8d08ad24f80
treefc8ce2c7a6188b72e8a84d0be1e0ad96d75c357btree | snapshot
parenta5563b85f6fab9cf81d27827e0146f621127047acommit | diff
test: reduce time for function reentrancy test

Reduced test duration for func_reentrancy_autotest.
Reduced MAX_LPM_ITER_TIMES, introduced new macro
MAX_ITER_ONCE to reduce the unique key check and
altered the macro MAX_ITER_TIMES to MAX_ITER_MULTI.
Combined for loops thereby reduced snprintf calls
and repeated iterations.
Such that the duration is less than 10 seconds.

Signed-off-by: Naga Suresh Somarowthu <naga.sureshx.somarowthu@intel.com>
Acked-by: Reshma Pattan <reshma.pattan@intel.com>
test/test/test_func_reentrancy.c diff | blob | history
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