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(parent: aaa7532) | patch
test/event: add null dev creation in Rx adapter autotest
authorJay Jayatheerthan <jay.jayatheerthan@intel.com>
Sat, 3 Oct 2020 09:05:41 +0000 (14:35 +0530)
committerJerin Jacob <jerinj@marvell.com>
Thu, 15 Oct 2020 19:49:59 +0000 (21:49 +0200)
commitdf19eda6b1090ed4e2dcf609338a337be3ef9681
treec9154c6446dbdf056528d0d2e2f74742e8197b57tree | snapshot
parentaaa75327ac63a7817e2ec9c58d72da8e575adf49commit | diff
test/event: add null dev creation in Rx adapter autotest

Allows creation of net_null if vdev EAL option is not specified and
uninit vdev created in the test. The change also adds error checks
for vdev init and uninit.

Signed-off-by: Jay Jayatheerthan <jay.jayatheerthan@intel.com>
Reviewed-by: Nikhil Rao <nikhil.rao@intel.com>
app/test/test_event_eth_rx_adapter.c diff | blob | history
DPDK repo used for reviews