return 0;
}
+static int
+evt_parse_timer_prod_type_burst(struct evt_options *opt,
+ const char *arg __rte_unused)
+{
+ opt->prod_type = EVT_PROD_TYPE_EVENT_TIMER_ADPTR;
+ opt->timdev_use_burst = 1;
+ return 0;
+}
+
static int
evt_parse_test_name(struct evt_options *opt, const char *arg)
{
"\t--prod_type_timerdev : use event timer device as producer.\n"
"\t expity_nsec would be the timeout\n"
"\t in ns.\n"
+ "\t--prod_type_timerdev_burst : use timer device as producer\n"
+ "\t burst mode.\n"
);
printf("available tests:\n");
evt_test_dump_names();
{ EVT_QUEUE_PRIORITY, 0, 0, 0 },
{ EVT_PROD_ETHDEV, 0, 0, 0 },
{ EVT_PROD_TIMERDEV, 0, 0, 0 },
+ { EVT_PROD_TIMERDEV_BURST, 0, 0, 0 },
{ EVT_HELP, 0, 0, 0 },
{ NULL, 0, 0, 0 }
};
{ EVT_QUEUE_PRIORITY, evt_parse_queue_priority},
{ EVT_PROD_ETHDEV, evt_parse_eth_prod_type},
{ EVT_PROD_TIMERDEV, evt_parse_timer_prod_type},
+ { EVT_PROD_TIMERDEV_BURST, evt_parse_timer_prod_type_burst},
};
for (i = 0; i < RTE_DIM(parsermap); i++) {