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(parent: 614af75) | patch
event/sw: switch test counter to dynamic mbuf field
authorThomas Monjalon <thomas@monjalon.net>
Mon, 26 Oct 2020 01:27:44 +0000 (02:27 +0100)
committerThomas Monjalon <thomas@monjalon.net>
Sat, 31 Oct 2020 15:13:11 +0000 (16:13 +0100)
commit70418e322ba3e5e3e0dbc7e058273a2e6e39f1cc
tree6d12038e2c6c77ab0dec672886e11e12a0d2a5fftree | snapshot
parent614af75489682e39bb005d80173434588e9490a6commit | diff
event/sw: switch test counter to dynamic mbuf field

The test worker_loopback used the deprecated mbuf field udata64.
It is moved to a dynamic field in order to allow removal of udata64.

Signed-off-by: Thomas Monjalon <thomas@monjalon.net>
Reviewed-by: Andrew Rybchenko <andrew.rybchenko@oktetlabs.ru>
Acked-by: Harry van Haaren <harry.van.haaren@intel.com>
drivers/event/sw/sw_evdev_selftest.c diff | blob | history
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