bpf: allow self-xor operation
[dpdk.git] / app / test-compress-perf / comp_perf.h
1 /* SPDX-License-Identifier: BSD-3-Clause
2  * Copyright(c) 2019 Intel Corporation
3  */
4
5 #ifndef _COMP_PERF_
6 #define _COMP_PERF_
7
8 #include <rte_mempool.h>
9
10 struct comp_test_data;
11
12 typedef void  *(*cperf_constructor_t)(
13                 uint8_t dev_id,
14                 uint16_t qp_id,
15                 struct comp_test_data *options);
16
17 typedef int (*cperf_runner_t)(void *test_ctx);
18 typedef void (*cperf_destructor_t)(void *test_ctx);
19
20 struct cperf_test {
21         cperf_constructor_t constructor;
22         cperf_runner_t runner;
23         cperf_destructor_t destructor;
24 };
25
26 /* Needed for weak functions*/
27
28 void *
29 cperf_throughput_test_constructor(uint8_t dev_id __rte_unused,
30                                  uint16_t qp_id __rte_unused,
31                                  struct comp_test_data *options __rte_unused);
32
33 void
34 cperf_throughput_test_destructor(void *arg __rte_unused);
35
36 int
37 cperf_throughput_test_runner(void *test_ctx __rte_unused);
38
39 void *
40 cperf_verify_test_constructor(uint8_t dev_id __rte_unused,
41                                  uint16_t qp_id __rte_unused,
42                                  struct comp_test_data *options __rte_unused);
43
44 void
45 cperf_verify_test_destructor(void *arg __rte_unused);
46
47 int
48 cperf_verify_test_runner(void *test_ctx __rte_unused);
49
50 #endif /* _COMP_PERF_ */