1 /* SPDX-License-Identifier: BSD-3-Clause
2 * Copyright(c) 2020 Intel Corporation
5 #include "test_ring_stress_impl.h"
6 #include <rte_ring_elem.h>
9 _st_ring_dequeue_bulk(struct rte_ring *r, void **obj, uint32_t n,
14 m = rte_ring_dequeue_bulk_start(r, obj, n, avail);
16 rte_ring_dequeue_finish(r, n);
20 static inline uint32_t
21 _st_ring_enqueue_bulk(struct rte_ring *r, void * const *obj, uint32_t n,
26 m = rte_ring_enqueue_bulk_start(r, n, free);
28 rte_ring_enqueue_finish(r, obj, n);
33 _st_ring_init(struct rte_ring *r, const char *name, uint32_t num)
35 return rte_ring_init(r, name, num,
36 RING_F_MP_HTS_ENQ | RING_F_MC_HTS_DEQ);
39 const struct test test_ring_mt_peek_stress = {
41 .nb_case = RTE_DIM(tests),