+/* SPDX-License-Identifier: BSD-3-Clause
+ * Copyright(c) 2020 Intel Corporation
+ */
+
+#include "test_ring_stress_impl.h"
+#include <rte_ring_elem.h>
+
+static inline uint32_t
+_st_ring_dequeue_bulk(struct rte_ring *r, void **obj, uint32_t n,
+ uint32_t *avail)
+{
+ uint32_t m;
+
+ m = rte_ring_dequeue_bulk_start(r, obj, n, avail);
+ n = (m == n) ? n : 0;
+ rte_ring_dequeue_finish(r, n);
+ return n;
+}
+
+static inline uint32_t
+_st_ring_enqueue_bulk(struct rte_ring *r, void * const *obj, uint32_t n,
+ uint32_t *free)
+{
+ uint32_t m;
+
+ m = rte_ring_enqueue_bulk_start(r, n, free);
+ n = (m == n) ? n : 0;
+ rte_ring_enqueue_finish(r, obj, n);
+ return n;
+}
+
+static int
+_st_ring_init(struct rte_ring *r, const char *name, uint32_t num)
+{
+ return rte_ring_init(r, name, num,
+ RING_F_MP_HTS_ENQ | RING_F_MC_HTS_DEQ);
+}
+
+const struct test test_ring_mt_peek_stress = {
+ .name = "MT_PEEK",
+ .nb_case = RTE_DIM(tests),
+ .cases = tests,
+};