test/bpf: skip test if libpcap is unavailable

test_bpf_convert is being conditionally registered depending on the
presence of RTE_HAS_LIBPCAP except the UT unconditionally lists it as a
test to run.

When the UT runs test_bpf_convert test-dpdk can't find the registration
and assumes the DPDK_TEST environment variable hasn't been defined
resulting in test-dpdk dropping to interactive mode and subsequently
waiting for the remainder of the UT fast-test timeout period before
reporting the test as having timed out.

* unconditionally register test_bpf_convert,
* if ! RTE_HAS_LIBPCAP provide a stub test_bpf_convert that reports the
  test is skipped similar to that done with the test_bpf test.

Fixes: 2eccf6afbea9 ("bpf: add function to convert classic BPF to DPDK BPF")
Cc: stable@dpdk.org
Signed-off-by: Tyler Retzlaff <roretzla@linux.microsoft.com>
Acked-by: Stephen Hemminger <stephen@networkplumber.org>
Acked-by: Konstantin Ananyev <konstantin.ananyev@intel.com>

diff --git a/app/test/test_bpf.c b/app/test/test_bpf.c
index 805cce6..97f5008 100644 (file)
--- a/app/test/test_bpf.c
+++ b/app/test/test_bpf.c
@@ -3264,7 +3264,16 @@ test_bpf(void)
 
 REGISTER_TEST_COMMAND(bpf_autotest, test_bpf);
 
-#ifdef RTE_HAS_LIBPCAP
+#ifndef RTE_HAS_LIBPCAP
+
+static int
+test_bpf_convert(void)
+{
+       printf("BPF convert RTE_HAS_LIBPCAP is undefined, skipping test\n");
+       return TEST_SKIPPED;
+}
+
+#else
 #include <pcap/pcap.h>
 
 static void
@@ -3462,5 +3471,6 @@ test_bpf_convert(void)
        return rc;
 }
 
-REGISTER_TEST_COMMAND(bpf_convert_autotest, test_bpf_convert);
 #endif /* RTE_HAS_LIBPCAP */
+
+REGISTER_TEST_COMMAND(bpf_convert_autotest, test_bpf_convert);