test/efd: replace config macro with runtime log level

This patch enables compilation of print_key_info() always using
log-level based approach instead of a macro. Need to set efd log type
to debug to print debug information, using the following eal parameter:
--log-level=test.efd:debug

Suggested-by: Thomas Monjalon <thomas@monjalon.net>
Signed-off-by: Dharmik Thakkar <dharmik.thakkar@arm.com>
Reviewed-by: Honnappa Nagarahalli <honnappa.nagarahalli@arm.com>
Reviewed-by: Gavin Hu <gavin.hu@arm.com>
Reviewed-by: Phil Yang <phil.yang@arm.com>
Reviewed-by: Ferruh Yigit <ferruh.yigit@intel.com>

diff --git a/app/test/test_efd.c b/app/test/test_efd.c
index ced091a..93e8f1c 100644 (file)
--- a/app/test/test_efd.c
+++ b/app/test/test_efd.c
@@ -31,31 +31,29 @@ struct flow_key {
        uint16_t port_dst;
        uint8_t proto;
 } __attribute__((packed));
+
+int efd_logtype_test;
+
+RTE_INIT(test_efd_init_log)
+{
+       efd_logtype_test = rte_log_register("test.efd");
+}
+
 /*
  * Print out result of unit test efd operation.
  */
-#if defined(UNIT_TEST_EFD_VERBOSE)
-
 static void print_key_info(const char *msg, const struct flow_key *key,
                efd_value_t val)
 {
        const uint8_t *p = (const uint8_t *) key;
        unsigned int i;
 
-       printf("%s key:0x", msg);
+       rte_log(RTE_LOG_DEBUG, efd_logtype_test, "%s key:0x", msg);
        for (i = 0; i < sizeof(struct flow_key); i++)
-               printf("%02X", p[i]);
+               rte_log(RTE_LOG_DEBUG, efd_logtype_test, "%02X", p[i]);
 
-       printf(" @ val %d\n", val);
+       rte_log(RTE_LOG_DEBUG, efd_logtype_test, " @ val %d\n", val);
 }
-#else
-
-static void print_key_info(__attribute__((unused)) const char *msg,
-               __attribute__((unused)) const struct flow_key *key,
-               __attribute__((unused)) efd_value_t val)
-{
-}
-#endif
 
 /* Keys used by unit test functions */
 static struct flow_key keys[5] = {