test/dma: increase iterations of capacity test case

To ensure we catch any bugs in calculation due to wrap-around of the id
values, increase the number of iterations of the burst_capacity test.

Signed-off-by: Bruce Richardson <bruce.richardson@intel.com>
Acked-by: Kevin Laatz <kevin.laatz@intel.com>

diff --git a/app/test/test_dmadev.c b/app/test/test_dmadev.c
index b206db27aeac77f07fefe61760fac6b6770f4fb9..db5aff701c1981f7918376371a8a0b5ba1de1f72 100644 (file)
--- a/app/test/test_dmadev.c
+++ b/app/test/test_dmadev.c
@@ -686,10 +686,11 @@ test_burst_capacity(int16_t dev_id, uint16_t vchan)
        /* to test capacity, we enqueue elements and check capacity is reduced
         * by one each time - rebaselining the expected value after each burst
         * as the capacity is only for a burst. We enqueue multiple bursts to
-        * fill up half the ring, before emptying it again. We do this twice to
-        * ensure that we get to test scenarios where we get ring wrap-around
+        * fill up half the ring, before emptying it again. We do this multiple
+        * times to ensure that we get to test scenarios where we get ring
+        * wrap-around and wrap-around of the ids returned (at UINT16_MAX).
         */
-       for (iter = 0; iter < 2; iter++) {
+       for (iter = 0; iter < 2 * (((int)UINT16_MAX + 1) / ring_space); iter++) {
                for (i = 0; i < (ring_space / (2 * CAP_TEST_BURST_SIZE)) + 1; i++) {
                        cap = rte_dma_burst_capacity(dev_id, vchan);