SRCS-y += test_ring.c
SRCS-y += test_ring_mpmc_stress.c
SRCS-y += test_ring_perf.c
+SRCS-y += test_ring_rts_stress.c
SRCS-y += test_ring_stress.c
SRCS-y += test_pmd_perf.c
--- /dev/null
+/* SPDX-License-Identifier: BSD-3-Clause
+ * Copyright(c) 2020 Intel Corporation
+ */
+
+#include "test_ring_stress_impl.h"
+
+static inline uint32_t
+_st_ring_dequeue_bulk(struct rte_ring *r, void **obj, uint32_t n,
+ uint32_t *avail)
+{
+ return rte_ring_mc_rts_dequeue_bulk(r, obj, n, avail);
+}
+
+static inline uint32_t
+_st_ring_enqueue_bulk(struct rte_ring *r, void * const *obj, uint32_t n,
+ uint32_t *free)
+{
+ return rte_ring_mp_rts_enqueue_bulk(r, obj, n, free);
+}
+
+static int
+_st_ring_init(struct rte_ring *r, const char *name, uint32_t num)
+{
+ return rte_ring_init(r, name, num,
+ RING_F_MP_RTS_ENQ | RING_F_MC_RTS_DEQ);
+}
+
+const struct test test_ring_rts_stress = {
+ .name = "MT_RTS",
+ .nb_case = RTE_DIM(tests),
+ .cases = tests,
+};
n += test_ring_mpmc_stress.nb_case;
k += run_test(&test_ring_mpmc_stress);
+ n += test_ring_rts_stress.nb_case;
+ k += run_test(&test_ring_rts_stress);
+
printf("Number of tests:\t%u\nSuccess:\t%u\nFailed:\t%u\n",
n, k, n - k);
return (k != n);