The device stats are retrieved in the testcase teardown function,
but are not being used afterwards. Remove this unnecessary call.
The stats retrieval for the device is being tested already by a
dedicated stats testcase.
Fixes: 202d375c60bc ("app/test: add cryptodev unit and performance tests")
Cc: stable@dpdk.org
Signed-off-by: Ciara Power <ciara.power@intel.com>
Acked-by: Anoob Joseph <anoobj@marvell.com>
{
struct crypto_testsuite_params *ts_params = &testsuite_params;
struct crypto_unittest_params *ut_params = &unittest_params;
- struct rte_cryptodev_stats stats;
/* free crypto session structure */
#ifdef RTE_LIB_SECURITY
RTE_LOG(DEBUG, USER1, "CRYPTO_MBUFPOOL count %u\n",
rte_mempool_avail_count(ts_params->mbuf_pool));
- rte_cryptodev_stats_get(ts_params->valid_devs[0], &stats);
-
/* Stop the device */
rte_cryptodev_stop(ts_params->valid_devs[0]);
}