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test/hash: test more corner cases
authorYipeng Wang <yipeng1.wang@intel.com>
Fri, 26 Oct 2018 09:53:43 +0000 (02:53 -0700)
committerThomas Monjalon <thomas@monjalon.net>
Fri, 26 Oct 2018 20:02:40 +0000 (22:02 +0200)
This commit improves the readwrite unit test to cover
more corner cases and reduces the testing time by
reducing the total key count.

Signed-off-by: Yipeng Wang <yipeng1.wang@intel.com>
Acked-by: Bruce Richardson <bruce.richardson@intel.com>

No differences found
DPDK repo used for reviews