test/ring: rename stress test for MT peek API

Rename test_ring_peek_stress to test_ring_mt_peek_stress to
keep same naming conventions for ST and MT test cases.

Signed-off-by: Konstantin Ananyev <konstantin.ananyev@intel.com>
Reviewed-by: Honnappa Nagarahalli <honnappa.nagarahalli@arm.com>

diff --git a/app/test/Makefile b/app/test/Makefile
index 37bdaf8..e544077 100644 (file)
--- a/app/test/Makefile
+++ b/app/test/Makefile
@@ -81,7 +81,7 @@ SRCS-y += test_ring.c
 SRCS-y += test_ring_mpmc_stress.c
 SRCS-y += test_ring_hts_stress.c
 SRCS-y += test_ring_perf.c
-SRCS-y += test_ring_peek_stress.c
+SRCS-y += test_ring_mt_peek_stress.c
 SRCS-y += test_ring_rts_stress.c
 SRCS-y += test_ring_st_peek_stress.c
 SRCS-y += test_ring_stress.c

diff --git a/app/test/meson.build b/app/test/meson.build
index 5cb0509..d8c5b52 100644 (file)
--- a/app/test/meson.build
+++ b/app/test/meson.build
@@ -105,7 +105,7 @@ test_sources = files('commands.c',
        'test_ring.c',
        'test_ring_mpmc_stress.c',
        'test_ring_hts_stress.c',
-       'test_ring_peek_stress.c',
+       'test_ring_mt_peek_stress.c',
        'test_ring_perf.c',
        'test_ring_rts_stress.c',
        'test_ring_st_peek_stress.c',

diff --git a/app/test/test_ring_mt_peek_stress.c b/app/test/test_ring_mt_peek_stress.c
new file mode 100644 (file)
index 0000000..4d52142
--- /dev/null
+++ b/app/test/test_ring_mt_peek_stress.c
@@ -0,0 +1,43 @@
+/* SPDX-License-Identifier: BSD-3-Clause
+ * Copyright(c) 2020 Intel Corporation
+ */
+
+#include "test_ring_stress_impl.h"
+#include <rte_ring_elem.h>
+
+static inline uint32_t
+_st_ring_dequeue_bulk(struct rte_ring *r, void **obj, uint32_t n,
+       uint32_t *avail)
+{
+       uint32_t m;
+
+       m = rte_ring_dequeue_bulk_start(r, obj, n, avail);
+       n = (m == n) ? n : 0;
+       rte_ring_dequeue_finish(r, n);
+       return n;
+}
+
+static inline uint32_t
+_st_ring_enqueue_bulk(struct rte_ring *r, void * const *obj, uint32_t n,
+       uint32_t *free)
+{
+       uint32_t m;
+
+       m = rte_ring_enqueue_bulk_start(r, n, free);
+       n = (m == n) ? n : 0;
+       rte_ring_enqueue_finish(r, obj, n);
+       return n;
+}
+
+static int
+_st_ring_init(struct rte_ring *r, const char *name, uint32_t num)
+{
+       return rte_ring_init(r, name, num,
+               RING_F_MP_HTS_ENQ | RING_F_MC_HTS_DEQ);
+}
+
+const struct test test_ring_mt_peek_stress = {
+       .name = "MT_PEEK",
+       .nb_case = RTE_DIM(tests),
+       .cases = tests,
+};

diff --git a/app/test/test_ring_peek_stress.c b/app/test/test_ring_peek_stress.c
deleted file mode 100644 (file)
index cfc82d7..0000000
--- a/app/test/test_ring_peek_stress.c
+++ /dev/null
@@ -1,43 +0,0 @@
-/* SPDX-License-Identifier: BSD-3-Clause
- * Copyright(c) 2020 Intel Corporation
- */
-
-#include "test_ring_stress_impl.h"
-#include <rte_ring_elem.h>
-
-static inline uint32_t
-_st_ring_dequeue_bulk(struct rte_ring *r, void **obj, uint32_t n,
-       uint32_t *avail)
-{
-       uint32_t m;
-
-       m = rte_ring_dequeue_bulk_start(r, obj, n, avail);
-       n = (m == n) ? n : 0;
-       rte_ring_dequeue_finish(r, n);
-       return n;
-}
-
-static inline uint32_t
-_st_ring_enqueue_bulk(struct rte_ring *r, void * const *obj, uint32_t n,
-       uint32_t *free)
-{
-       uint32_t m;
-
-       m = rte_ring_enqueue_bulk_start(r, n, free);
-       n = (m == n) ? n : 0;
-       rte_ring_enqueue_finish(r, obj, n);
-       return n;
-}
-
-static int
-_st_ring_init(struct rte_ring *r, const char *name, uint32_t num)
-{
-       return rte_ring_init(r, name, num,
-               RING_F_MP_HTS_ENQ | RING_F_MC_HTS_DEQ);
-}
-
-const struct test test_ring_peek_stress = {
-       .name = "MT_PEEK",
-       .nb_case = RTE_DIM(tests),
-       .cases = tests,
-};

diff --git a/app/test/test_ring_stress.c b/app/test/test_ring_stress.c
index 387cfa7..c4f82ea 100644 (file)
--- a/app/test/test_ring_stress.c
+++ b/app/test/test_ring_stress.c
@@ -46,8 +46,8 @@ test_ring_stress(void)
        n += test_ring_hts_stress.nb_case;
        k += run_test(&test_ring_hts_stress);
 
-       n += test_ring_peek_stress.nb_case;
-       k += run_test(&test_ring_peek_stress);
+       n += test_ring_mt_peek_stress.nb_case;
+       k += run_test(&test_ring_mt_peek_stress);
 
        n += test_ring_st_peek_stress.nb_case;
        k += run_test(&test_ring_st_peek_stress);

diff --git a/app/test/test_ring_stress.h b/app/test/test_ring_stress.h
index a9a3903..c85d6fa 100644 (file)
--- a/app/test/test_ring_stress.h
+++ b/app/test/test_ring_stress.h
@@ -35,5 +35,5 @@ struct test {
 extern const struct test test_ring_mpmc_stress;
 extern const struct test test_ring_rts_stress;
 extern const struct test test_ring_hts_stress;
-extern const struct test test_ring_peek_stress;
+extern const struct test test_ring_mt_peek_stress;
 extern const struct test test_ring_st_peek_stress;