test/graph: use better randomness

Fix weak crypto issues reported by Coverity.

Fixes: 6b89650418 ("test/graph: add functional tests")

Signed-off-by: Kiran Kumar K <kirankumark@marvell.com>
Acked-by: Jerin Jacob <jerinj@marvell.com>

diff --git a/app/test/test_graph.c b/app/test/test_graph.c
index cf6df07..dfb71b4 100644 (file)
--- a/app/test/test_graph.c
+++ b/app/test/test_graph.c
@@ -12,6 +12,7 @@
 #include <rte_graph.h>
 #include <rte_graph_worker.h>
 #include <rte_mbuf.h>
+#include <rte_random.h>
 
 #include "test.h"
 
@@ -145,7 +146,7 @@ uint16_t
 test_node_worker_source(struct rte_graph *graph, struct rte_node *node,
                        void **objs, uint16_t nb_objs)
 {
-       uint32_t obj_node0 = rand() % 100, obj_node1;
+       uint32_t obj_node0 = rte_rand() % 100, obj_node1;
        test_main_t *tm = &test_main;
        struct rte_mbuf *data;
        void **next_stream;
@@ -193,7 +194,7 @@ test_node0_worker(struct rte_graph *graph, struct rte_node *node, void **objs,
        test_main_t *tm = &test_main;
 
        if (*(uint32_t *)node->ctx == test_node0.id) {
-               uint32_t obj_node0 = rand() % 100, obj_node1;
+               uint32_t obj_node0 = rte_rand() % 100, obj_node1;
                struct rte_mbuf *data;
                uint8_t second_pass = 0;
                uint32_t count = 0;